发明名称 Semiconductor device and inspection method therefor
摘要 A semiconductor device includes a circuit block formed in a peripheral edge portion of a semiconductor chip, a circuit block pad formed on the circuit block providing an electrical connection for said circuit block, and a bonding pad laterally offset from the circuit block and the circuit block pad, the bonding pad being electrically connected to the circuit block pad and electrically connected to a lead frame by a bonding wire, the laterally offset bonding pad thereby functioning as a substitute wire bonding pad for the circuit block.
申请公布号 US2009273064(A1) 申请公布日期 2009.11.05
申请号 US20090385541 申请日期 2009.04.10
申请人 NEC ELECTRONICS CORPORATION 发明人 KATOU TETSUYA
分类号 H01L23/495;H01L21/768;H02H9/04 主分类号 H01L23/495
代理机构 代理人
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