发明名称 BACKUP DEVICE AND SEMICONDUCTOR TESTING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a backup device for effectively performing the backup of necessary data stored in a storage device even when power supply is interrupted. <P>SOLUTION: A backup device 20 is provided with: a backup power supply line L10 installed separately from power supply lines L1 and L2 which supply a power source from an auxiliary power source 2b to non-backup parts P11 and P21 which does not need to perform the backup of a memory 11 or a register 12, and configured to supply a power source from the auxiliary power source 2b to backup parts P12 and P22 which need to perform backup; a power source 21 for holding for performing the backup of data stored in the backup parts P12 and P22; and a switching circuit 22 for monitoring the backup power supply line L10, and for, when power supply from the auxiliary power source 2b is interrupted, switching power supply to the backup parts P12 and P22 to power supply from the power source 21 for holding. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2009258789(A) 申请公布日期 2009.11.05
申请号 JP20080103733 申请日期 2008.04.11
申请人 YOKOGAWA ELECTRIC CORP 发明人 KOGANEZAWA ATSUSHI
分类号 G06F12/16;G01R31/28 主分类号 G06F12/16
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