Device for testing semiconductor storage unit, comprises number of storage cells, which are controllable over internal lines, where test voltage is applied on internal line

摘要

The device comprises a number of storage cells, which are controllable over internal lines (WL). A semiconductor storage unit is provided, which has a test circuit (TS), which is formed, such that the internal line of the semiconductor storage unit is linked with the test circuit. A test voltage (V2) is applied on the internal line, and the internal line is supplied with current. An independent claim is included for a method for testing a semiconductor storage unit.