CONTACT FOR ELECTRICAL TEST OF ELECTRONIC DEVICES, METHOD FOR MANUFACTURING THE SAME, AND PROBE ASSEMBLY

摘要

PURPOSE: A contact for electrically testing an electronic device, a probe assembly and a manufacturing method thereof are provided to prevent misalignment of the adjacent contact by bonding the contact with the substrate using the light with low heat energy. CONSTITUTION: A first area(24) is bonded in a substrate. A second area(26) is extended from the first area to left and right direction and is elastically changed. A third area has a needle line in contact with an electrode of a semiconductor device. A low light reflective film(40) is formed on at least part of the bonding part of the substrate in the first area. The light reflective film is made of the material with the reflectivity lower than the reflectivity of the visible rays of the first area. A contact(16) includes the substrate bonded in the first area.