发明名称 PARTICLE ANALYZER AND PARTICLE ANALYSIS METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a particle analyzer capable of making an analysis based on the internal structure of subject particles while minimizing damage of the subject particles. Ž<P>SOLUTION: The particle analyzer 100 includes a light source part 1 generating excitation light; an irradiation optical system 2 irradiating the flow of a sample liquid 71 including cells 8 which are the subject particles, with the excitation light; a detecting part 4 detecting nonlinear Raman scattered light generated from the cells 8 by the irradiation of the excitation light; and an analyzing part 5 for processing signals from the detecting part 4 to analyze the cells 8. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2009258071(A) 申请公布日期 2009.11.05
申请号 JP20080208808 申请日期 2008.08.14
申请人 FUJIFILM CORP 发明人 HASEGAWA KAZUHIDE
分类号 G01N15/14;G01N21/65 主分类号 G01N15/14
代理机构 代理人
主权项
地址