发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT AND EVALUATION CIRCUIT OF SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 <P>PROBLEM TO BE SOLVED: To measure a current consumed by an internal circuit of a semiconductor integrated circuit. Ž<P>SOLUTION: The semiconductor integrated circuit 101 has: power supply conductors 111 and 112 of individual circuit blocks; and power supply switches 121, 122 and 123 which control connections between the conductors, and the power supply conductor 111 is connected with an evaluation circuit 102 of the semiconductor integrated circuit through the intermediary of a pad 131. The evaluation circuit 102 of the semiconductor integrated circuit can measure the current consumed by the circuit block 103, by controlling the power supply switches 121, 122 and 123, since the evaluation circuit is formed individually for pads 131, 132 and 133. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2009257765(A) 申请公布日期 2009.11.05
申请号 JP20060224858 申请日期 2006.08.22
申请人 PANASONIC CORP 发明人 NAKAYAMA TAKESHI;ISHII MASAHIRO;SAITO YOSHIYUKI
分类号 G01R31/28;H01L21/822;H01L27/04 主分类号 G01R31/28
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