摘要 |
Provided are an apparatus and a method for measuring a three-dimensional shape with improved accuracy. The apparatus includes a stage, at least one lighting unit, a plurality of image pickup units and a control unit. The stage supports an object to be measured. The lighting unit includes a light source and a grid, and radiates grid-patterned light onto the object to be measured. The image pickup units capture, in different directions, grid images reflected from the object to be measured. The control unit calculates a three-dimensional shape of the object from the grid images captured by the image pickup units. The present invention has advantages in capturing grid images through a main image pickup portion and sub-image pickup portions, enabling the measurement of the three-dimensional shape of the object in a rapid and accurate manner. |
申请人 |
KOH YOUNG TECHNOLOGY INC.;LEE, SEUNG-JUN;KHO, KWANG-ILL;JEON, MOON-YOUNG;YUN, SANG-KYU;KIM, HONG-MIN;HUR, JUNG |
发明人 |
LEE, SEUNG-JUN;KHO, KWANG-ILL;JEON, MOON-YOUNG;YUN, SANG-KYU;KIM, HONG-MIN;HUR, JUNG |