发明名称 LOCALIZED CALIBRATION OF PROGRAMMABLE DIGITAL LOGIC CELLS
摘要 <p>An integrated circuit (IC) (420) includes self-calibrating programmable digital logic circuitry. The IC includes at least one programmable digital logic cell (431A-431E), wherein the programmable digital logic cell provides (i) a plurality of different accessible circuit configurations or (ii) a voltage level controller. A self-calibration system (435) is provided that includes at least one reference device (430), a measurement device (441) for measuring at least one electrical performance parameter that can affect a processing speed of the programmable digital logic cell (421A-431E) or at least one parameter that can affect the electrical performance parameter using the reference device to obtain calibration data. A processing device (442) maps the calibration data or a parameter derived therefrom to generate a control signal (446) that is operable to select from the plurality of different accessible circuit configurations or a voltage level output to change the processing speed of the programmable digital logic cell.</p>
申请公布号 WO2009135143(A2) 申请公布日期 2009.11.05
申请号 WO2009US42548 申请日期 2009.05.01
申请人 TEXAS INSTRUMENTS INCORPORATED;BATRA, ANUJ;LINGAM, SRINIVAS;LEE, KIT, WING, S.;BITTLESTONE, CLIVE, D.;AMERASEKERA, EKANAYAKE, A. 发明人 BATRA, ANUJ;LINGAM, SRINIVAS;LEE, KIT, WING, S.;BITTLESTONE, CLIVE, D.;AMERASEKERA, EKANAYAKE, A.
分类号 G11C16/34;G11C11/00;G11C16/10 主分类号 G11C16/34
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