| 摘要 |
PURPOSE: A semiconductor memory device, a driving method thereof, and a compression test method are provided to perform a compression test mode using data applied through the minimum input and output pad. CONSTITUTION: A plurality of banks(410A) include a plurality of memory cells. A pattern signal generator(490) generates a plurality of pattern signals. The plurality of pattern signals have a plurality of combinations in response to the input signal applied through an arbitrary pad in the compression test mode. The pattern signals are transmitted to the bank through the plurality of input paths. A pattern selector selects the pattern of the pattern signals in response to the input signal and the pattern selection signal. A pattern signal output unit outputs the output signal of the pattern selector as the pattern signals.
|
