发明名称 |
METHOD FOR FABRICATING DIELECTRIC FILM AND CAPACITOR |
摘要 |
<p>PURPOSE: A dielectric layer and a method for manufacturing a capacitor are provided to minimize impurity from penetrating the dielectric layer by suppressing the crystal growth of a high dielectric layer. CONSTITUTION: A high dielectric layer with the thickness without the surface roughness is formed. The thermal process and the nitrification process are progressed in the high dielectric layer. The high dielectric layer includes one of groups comprised of ZrO2, LaO2, HfO2, and PZT. The thermal process is one of a plasma annealing process, a rapid thermal process, and furnace annealing. The thermal process is performed using non-reduction gas.</p> |
申请公布号 |
KR20090114994(A) |
申请公布日期 |
2009.11.04 |
申请号 |
KR20080040908 |
申请日期 |
2008.04.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
PARK, KYUNG WOONG;ROH, JAE SUNG;LEE, KEE JEUNG;KIL, DEOK SIN;KIM, YOUNG DAE;KIM, JIN HYOCK;DO, KWAN WOO |
分类号 |
H01L27/115 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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