A thin film device comprises: (a) a metal sulfide layer formed on a single crystal silicon substrate (1) by epitaxial growth; and (b) a compound thin film (3) with ionic bonding formed on the metal sulfide layer by epitaxial growth. An independent claim is also included for the fabrication of a thin film device comprising: (a) epitaxially growing metal sulfide on a single crystal silicon substrate by feeding molecular metal sulfide on the single crystal silicon substrate under a reduced pressure; and (b) epitaxially growing a compound thin film with ionic bonding on the metal sulfide.
申请公布号
EP1403911(A3)
申请公布日期
2009.11.04
申请号
EP20030255869
申请日期
2003.09.19
申请人
TOKYO INSTITUTE OF TECHNOLOGY;NATIONAL INSTITUTE FOR MATERIALS SCIENCE;FUJI ELECTRIC CORPORATE RESEARCH AND DEVELOPMENT LTD
发明人
KOINUMA, HIDEOMI;SONG, JEONG HWAN;CHIKYO, TOYOHIRO;YOO, YOUNG ZO;AHMET, PARHAT;KONISHI, YOSHINORI;YONEZAWA, YOSHIYUKI