发明名称 Microelectronic devices using sacrificial layers and structures fabricated by same
摘要 A dielectric layer is formed on a region of a microelectronic substrate. A sacrificial layer is formed on the dielectric layer, and portions of the sacrificial layer and the dielectric layer are removed to form an opening that exposes a portion of the region. A conductive layer is formed on the sacrificial layer and in the opening. Portions of the sacrificial layer and the conductive layer on the dielectric layer are removed to leave a conductive plug in the dielectric layer and in contact with the region. Removal of the sacrificial layer and portions of the conductive layer on the dielectric layer may include polishing to expose the sacrificial layer and to leave a conductive plug in the sacrificial layer and the dielectric layer, etching the sacrificial layer to expose the dielectric layer and leave a portion of the conductive plug protruding from the dielectric layer, and polishing to remove the protruding portion of the conductive plug. Phase-change memory devices formed by such techniques are also discussed.
申请公布号 US7612359(B2) 申请公布日期 2009.11.03
申请号 US20070860674 申请日期 2007.09.25
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI SUK-HUN;SON YOON-HO;CHO SUNG-LAE;PARK JOON-SANG
分类号 H01L21/28;H01L29/02;H01L21/20;H01L21/44;H01L27/24;H01L45/00 主分类号 H01L21/28
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