发明名称 |
Method to form a current confining path of a CPP GMR device |
摘要 |
Concerns about inadequate electromigration robustness in CCP CPP GMR devices have been overcome by adding magnesium to the current confining structures that are presently in use. In one embodiment the alumina layer, in which the current carrying copper regions are embedded, is fully replaced by a magnesia layer. In other embodiments, alumina is still used but a layer of magnesium is included within the structure before it is subjected to ion assisted oxidation.
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申请公布号 |
US7610674(B2) |
申请公布日期 |
2009.11.03 |
申请号 |
US20060352676 |
申请日期 |
2006.02.13 |
申请人 |
HEADWAY TECHNOLOGIES, INC. |
发明人 |
ZHANG KUNLIANG;ABELS DANIEL G;LI MIN;CHEN YU-HSIA |
分类号 |
G11B5/127;H04R31/00 |
主分类号 |
G11B5/127 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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