发明名称 Electronic device test apparatus for successively testing electronic devices
摘要 An apparatus having a plurality of test units (520), a loading transport unit (510) transporting a plurality of electronic devices from a customer tray (4C) to a test tray (4T) before being loaded in a test unit, and a classifying transport unit (530) transporting a plurality of electronic devices from a test tray while classifying them to customer trays in accordance with test results, the loading transport unit being provided at least at a frontmost stage of a plurality of test units, the classifying transport unit being provided at least at a rearmost stage of the plurality of test units, the test tray being successively conveyed from the frontmost stage to the rearmost stage of the plurality of test units in the state carrying electronic devices and returned from the rearmost stage test unit to the frontmost stage test unit.
申请公布号 US7612575(B2) 申请公布日期 2009.11.03
申请号 US20050571428 申请日期 2005.07.25
申请人 ADVANTEST CORPORATION 发明人 ITO AKIHIKO;YAMASHITA KAZUYUKI;KOBAYASHI YOSHIHITO
分类号 G01R31/26;G01R31/28 主分类号 G01R31/26
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