发明名称 Test apparatus, manufacturing method, and test method
摘要 There is provided a test apparatus for testing a device under test, the test apparatus including: a test signal supplying section that supplies a digital input signal for testing purposes, to the device under test; a reference signal output section that outputs an analogue reference signal in accordance with the digital input signal; a difference obtaining section that outputs an analogue difference signal representing a difference between the analogue reference signal and an analogue output signal outputted by the device under test in accordance with the digital input signal; and a determining section that determines whether the analogue output signal shows a defect or not based on the analogue difference signal.
申请公布号 US7612698(B2) 申请公布日期 2009.11.03
申请号 US20080145510 申请日期 2008.06.25
申请人 ADVANTEST CORPORATION 发明人 KIMURA HIROKI
分类号 H03M1/10 主分类号 H03M1/10
代理机构 代理人
主权项
地址