发明名称 Method to control uniformity/composition of metal electrodes, silicides on topography and devices using this method
摘要 A method for depositing metals on surfaces is provided which comprises (a) providing a substrate (103) having a horizontal surface (107) and a vertical surface (105); (b) depositing a first metal layer (109) over the horizontal and vertical surfaces; (c) depositing a layer of polysilicon (111) over the horizontal and vertical surfaces; (d) treating the layer of polysilicon with a plasma such that a residue (113) remaining from the treatment is preferentially formed over the horizontal surfaces rather than the vertical surfaces, and wherein the residue is resistant to a first metal etch; and (e) exposing the substrate to the first metal etch.
申请公布号 US7611936(B2) 申请公布日期 2009.11.03
申请号 US20070803097 申请日期 2007.05.11
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 MATHEW LEO;NOBLE ROSS E.;RAI RAGHAW S.
分类号 H01L21/336 主分类号 H01L21/336
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