发明名称 Semiconductor integrated circuit, and designing method and testing method thereof
摘要 A semiconductor integrated circuit comprises a combinational circuit section having a combinational circuit, a scan path circuit for inputting and outputting a value from and to the combinational circuit section in accordance with a scan enable signal and in synchronization with a clock signal, and a clock control section for generating and outputting a predetermined number of pulses as the clock signal after a predetermined period has passed since a time when an output command signal was received. The clock control section has an oscillator circuit for generating and outputting the pulse, and is configured to output a last pulse of the predetermined number of pulses in a manner which holds a logical value immediately after an active edge for the scan path circuit.
申请公布号 US7613972(B2) 申请公布日期 2009.11.03
申请号 US20060585778 申请日期 2006.10.25
申请人 PANASONIC CORPORATION 发明人 TAKEOKA SADAMI;YOSHIMURA SHINICHI
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
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