发明名称 |
METHOD OF FABRICATING PHOTOELECTRIC DEVICE OF GROUP III NITRIDE SEMICONDUCTOR AND STRUCTURE THEREOF |
摘要 |
PURPOSE: A method of fabricating photoelectric device of group iii nitride semiconductor and structure thereof are provided to form the patterned epitaxial blocking layer by using grooves between convexes. CONSTITUTION: The first group III nitride semiconductor layer(62) is formed on the substrate(61). The epitaxial blocking layer patterned on the first group III nitride semiconductor layer is formed. The second group III nitride semiconductor layer(64) is formed on the exposed region of the patterned epitaxial blocking layer and the first group III nitride semiconductor layer. The patterned epitaxial blocking layer is removed. The third group III nitride semiconductor layer(65) is formed on the second group III nitride semiconductor layer. The conductive layer(67) is formed on the third group III nitride semiconductor layer.
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申请公布号 |
KR20090113794(A) |
申请公布日期 |
2009.11.02 |
申请号 |
KR20090037183 |
申请日期 |
2009.04.28 |
申请人 |
ADVANCED OPTOELECTRONIC TECHNOLOGY INC. |
发明人 |
TU PO MIN;HUANG SHIH CHENG;LIN WEN YU;HSU CHIH PENG;CHAN SHIH HSIUNG |
分类号 |
H01L21/8252;H01L31/04;H01L33/10;H01L33/32 |
主分类号 |
H01L21/8252 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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