发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method of manufacturing semiconductor device is provided to minimize the loss of the insulating layer for the element isolation generated in the pad area. CONSTITUTION: The semiconductor substrate(100) includes the cell region, the peripheral area and the pad area(P) which connects the peripheral area(PE). The gate electrode(G) of the vertical TR is formed in the outer surface. The metal oxide layer which covers the outer surface of the vertical TR is formed. The insulating layer(114a) which has the etching selectivity different from the metal oxide layer is formed. The metal oxide layer which covers the gate electrode is removed from the vertical TR. The wiring is formed to be connected to the gate electrode.
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申请公布号 |
KR20090113670(A) |
申请公布日期 |
2009.11.02 |
申请号 |
KR20080039514 |
申请日期 |
2008.04.28 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
HAN, JI HYE;OH, KEE JOON;KIM, GYU HYUN;KIM, JUNG NAM |
分类号 |
H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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