发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A method of manufacturing semiconductor device is provided to minimize the loss of the insulating layer for the device isolation generated in the pad area. CONSTITUTION: The pillar type active pattern(103) is formed in the semiconductor substrate(100). The pad area(P) connects the peripheral area(PE), the cell[cell]area(C) and peripheral area. The vertical TR in which the gate electrode(G) is formed in the outer side surface is formed in the cell region. The barrier film which covers the outer side surface of the vertical TR is formed. The insulating layer which makes the part corresponding to the gate electrode exposed is formed. The resist pattern which protects the pad area is formed and the cell region and peripheral area are exposed. The wiring is formed to connect the gate electrode.</p>
申请公布号 KR20090113667(A) 申请公布日期 2009.11.02
申请号 KR20080039511 申请日期 2008.04.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 OH, KEE JOON;KIM, GYU HYUN;KIM, JUNG NAM;HAN, JI HYE
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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