| 摘要 |
<p>The method involves producing output bundle from measuring beam bundles and a reference beam bundle with known ten wavelengths, which does not resemble the m wavelengths. An interferometer bundle is overlaid with another interferometer bundle after passing through an interferometer arm for producing interference beam. The length of the interferometer arm is varied during predetermined measuring period. An independent claim is included for a device for determination of m different wavelengths of m optical measuring beam bundles.</p> |
