| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To almost exactly estimate the lifetime of an optical semiconductor device even when a drive condition changes, or an individual difference of the optical semiconductor device is present in a method of estimating the lifetime of the optical semiconductor device. <P>SOLUTION: In the method of estimating the lifetime of an optical semiconductor device, the maximum light output value is extracted by measuring the characteristics of light output with respect to a drive current for the optical semiconductor device whose maximum light output value is limited by thermal saturation. The decrease tendency of the maximum output values with the drive time is estimated to estimate the lifetime of the optical semiconductor. Further, the estimated lifetime is updated as time passes. <P>COPYRIGHT: (C)2010,JPO&INPIT</p> |
