发明名称 CHEMICAL MECHANICAL POLISHING PAD, AND CHEMICAL MECHANICAL POLISHING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a chemical mechanical polishing pad, along with a chemical mechanical polishing method using the same, which is excellent in polishing speed and in-surface uniformity in polishing amount on a polished surface, with less scratching and sliding resistance. <P>SOLUTION: The chemical mechanical polishing pad has such a polishing layer which contains (A) polyethylene by 5-95 pts.mass, (B) styrene-butadiene copolymer by 95-5 pts.mass and (C) water-soluble substance by 5-80 pts.volume against the total 100 pts.volume of (A) component and (B) component. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2009252891(A) 申请公布日期 2009.10.29
申请号 JP20080097164 申请日期 2008.04.03
申请人 JSR CORP 发明人 SUGIURA KAZUO;NISHIMURA HIDEKI
分类号 H01L21/304;B24B37/24 主分类号 H01L21/304
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