发明名称 LITHOGRAPHIC APPARATUS, DEVICE MANUFACTURING METHOD, CLEANING SYSTEM AND METHOD FOR CLEANING A PATTERNING DEVICE
摘要 <p>A lithographic apparatus includes an illumination system configured to condition a beam of radiation, and a support structure configured to support a patterning device. The patterning device is configured to impart a pattern to the beam of radiation. The apparatus includes a patterning device cleaning system configured to provide an electrostatic force to contaminant particles that are on the patterning device and that are electrically charged by the beam of radiation, in order to remove the contaminant particles from the patterning device.</p>
申请公布号 WO2009129960(A1) 申请公布日期 2009.10.29
申请号 WO2009EP02782 申请日期 2009.04.16
申请人 ASML NETHERLANDS B. V.,;SCACCABAROZZI, LUIGI;IVANOV, VLADIMIR, VITALEVITCH;KOSHELEV, KONSTANTIN, NIKOLAEVICH;MOORS, JOHANNES, HUBERTUS, JOSEPHINA;STEVENS, LUCAS, HENRICUS, JOHANNES;ANTSIFEROV, PAVEL, STANISLAVOVICH;KRIVTSUN, VLADIMIR, MIHAILOVITCH;DOROKHIN, LEONID, ALEXANDROVICH;VAN KAMPEN, MAARTEN 发明人 SCACCABAROZZI, LUIGI;IVANOV, VLADIMIR, VITALEVITCH;KOSHELEV, KONSTANTIN, NIKOLAEVICH;MOORS, JOHANNES, HUBERTUS, JOSEPHINA;STEVENS, LUCAS, HENRICUS, JOHANNES;ANTSIFEROV, PAVEL, STANISLAVOVICH;KRIVTSUN, VLADIMIR, MIHAILOVITCH;DOROKHIN, LEONID, ALEXANDROVICH;VAN KAMPEN, MAARTEN
分类号 G03F7/20 主分类号 G03F7/20
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