发明名称 PATTERN INSPECTION DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a pattern inspection device for enabling the verification based on an image containing the data related to the shape in the thickness direction of a wiring pattern. Ž<P>SOLUTION: (A) and (B) respectively show the two-dimensional image of reflected light and the two-dimensional image of transmitted light and (C) shows a synthetic image displayed by superposing both images one upon another. Since wiring patterns P1r, P2r and P3r and wiring patterns P1t, P2t and P3t are different in width from each other, the intermediate regions held between the contours of P1r, P2r and P3r and the contours of P1t, P2t and P3t can be clearly visually confirmed in the synthetic image (C). Since the images of the intermediate regions show the shapes of the oblique surfaces in the wiring patterns forming a trapezoidal cross section, the detection of the wiring patterns such as shorts f1, breaks f2 or the like can be performed in an extremely easy manner by the visual observation of the intermediate regions. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2009250620(A) 申请公布日期 2009.10.29
申请号 JP20080094958 申请日期 2008.04.01
申请人 NIPPON AVIONICS CO LTD 发明人 HATTORI SHINICHI
分类号 G01N21/956;G06T1/00;H05K3/00 主分类号 G01N21/956
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