发明名称 STAGE SYSTEM AND LITHOGRAPHIC APPARATUS EQUIPPED WITH THE STAGE SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To improve accuracy of position measurement of a stage in a lithographic apparatus. <P>SOLUTION: A stage system includes a movable stage, at least two encoder heads each of which supplies an encoder signal representing a position of the movable stage relative to an encoder target structure, and a controller, for controlling the position of the stage, to which the encoder signals from each of the encoder head is supplied, wherein the controller applies weighting function to the encoder signals and determines the position of the stage from the weighted encoder signals. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2009253287(A) 申请公布日期 2009.10.29
申请号 JP20090088604 申请日期 2009.04.01
申请人 ASML NETHERLANDS BV 发明人 KAMIDI RAMIDIN I;COX HENRIKUS HERMAN MARIE;EUSSEN EMIEL JOZEF MELANIE;KUNST RONALD C;VAN DER PASCH ENGELBERTUS ANTONIUS FRANSISCUS;HEERTJES MARCEL FRANCOIS;MARK CONSTANT JOHANNES BAGGEN
分类号 H01L21/027;G03F7/20;H01L21/68 主分类号 H01L21/027
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