发明名称 YIELD STRESS MEASURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To easily determine the yield stress of a sample, in a short time. Ž<P>SOLUTION: The yield stress determination method comprises: forming an indentation on the sample, by pressing-in a pillar-shaped indenter into the sample by applying an increasing load and then applying a decreasing load to the indenter not to press-in the indenter; acquiring data of the indenter load-indentation depth at this time; determining an inflection point stress σ<SB>i</SB>, by calculating the pressing load at the inflection point on a pressing load-indentation depth characteristic line obtained from the pressing load-indentation depth data; and determining the target yield stress of the sample, by calculating stress σ<SB>y</SB>which is represented by equation: σ<SB>y</SB>=a×σ<SB>i</SB>-b (where a=7.9 to 8.3, and b=260 to 310), using the inflection point stress σ<SB>i</SB>. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2009250689(A) 申请公布日期 2009.10.29
申请号 JP20080096507 申请日期 2008.04.02
申请人 FUTURE-TECH CORP;UNIV WASEDA 发明人 FUKUMOTO MITOSHI;TANAKA TSUNEJI;ASAKAWA MOTOO;SANO MOTOHIKO;SUZUKI YOHEI;KONNO FUYUKI
分类号 G01N3/42 主分类号 G01N3/42
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