| 摘要 |
A method and system utilizing a network analyzer and a test controller for measuring scattering parameters (S-parameters) of a microwave device that rapidly switches through a plurality of states. The test controller sends a trigger to the analyzer, which starts a frequency sweep having substantially the same start and stop frequency, and provides the sweep to the device. The analyzer then measures and stores at least one S-parameter of the device and provides the test controller with a trigger. The test controller updates the device to the next state in a predetermined sequence of states and the above steps are iteratively repeated until S-parameters for all of the states in the sequence have been measured.
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