发明名称 EFFECTIVE-INDUCTANCE-CHANGE BASED MAGNETIC PARTICLE SENSING
摘要 The invention relates to an integrated measurement system to detect a quantity of magnetic particles in a sample. The measurement system includes a substrate. An electromagnetic (EM) structure disposed on the surface of the substrate is configured to receive a sample including the magnetic particles in proximity thereof. The integrated measurement system also includes an electrical current generator disposed on the surface of the substrate which is electro-magnetically coupled to the EM structure. The electrical current generator is configured to cause an electrical current to flow in the EM structure. The integrated measurement system also includes an effective inductance sensor disposed on the surface of the substrate which is configured to measure a selected one of an effective inductance and a change in effective inductance. The invention also relates to a method to determine the number of and/or the locations of the magnetic particles in a sample.
申请公布号 US2009267596(A1) 申请公布日期 2009.10.29
申请号 US20090399603 申请日期 2009.03.06
申请人 CALIFORNIA INSTITUTE OF TECHNOLOGY 发明人 WANG HUA;HAJIMIRI SEYED ALI;CHEN YAN
分类号 G01N27/00;G01R33/00 主分类号 G01N27/00
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