发明名称 |
Dynamically Reconfigurable Shared Scan-In Test Architecture |
摘要 |
A low overhead dynamically reconfigurable shared scan-in test architecture is provided. This test architecture advantageously allows for changing scan inputs during the scan operation on a per shift basis. The flexibility of reconfiguring the scan input to scan chain mapping every shift cycle can advantageously reduce both test data volume and test application time.
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申请公布号 |
US2009271673(A1) |
申请公布日期 |
2009.10.29 |
申请号 |
US20090500296 |
申请日期 |
2009.07.09 |
申请人 |
SYNOPSYS, INC. |
发明人 |
KAPUR ROHIT;SITCHINAVA NODARI;SAMARANAYAKE SAMITHA;GIZDARSKI EMIL;NEUVEUX FREDERIC J.;DUGGIRALA SURYANARAYANA;WILLIAMS THOMAS W. |
分类号 |
G01R31/3177;G01R31/28;G01R31/3185;G06F11/25 |
主分类号 |
G01R31/3177 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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