发明名称 Method for estimating scattered ray intensity in X-ray CT and X-ray CT apparatus
摘要 A method for estimating a scattered ray intensity distribution in an X-ray CT apparatus, the method includes: irradiating a subject with X-rays; and configuring a cross-sectional image of the subject by detecting the X-rays passing through the subject, on the basis of a path length of a scattered ray passing through the subject, an X-ray absorption coefficient of the subject and an X-ray scattering probability of the subject, intensity of the scattered ray being calculated.
申请公布号 US7609803(B2) 申请公布日期 2009.10.27
申请号 US20080244259 申请日期 2008.10.02
申请人 KABUSHIKI KAISHA TOSHIBA;TOSHIBA MEDICAL SYSTEMS CORPORATION 发明人 OKAMOTO YOSUKE;AKINO NARUOMI
分类号 A61B6/00 主分类号 A61B6/00
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