发明名称 PROBE UNIT FOR INSPECTED THE FLAT PANEL DISPLAY DEVICE
摘要 PURPOSE: A probe unit for inspecting a flat panel display device is provided to minimize the deviation of a probe block and a TCP block by aligning the probe block and the TCP block to an accurate position and fastening them with an anchor bolt. CONSTITUTION: In a probe unit for inspecting a flat panel display device, slits(36,38) are fitted to a pad pitch of a flat panel display device and are slid by a certain depth. Contact probes(37) of a certain length are arranged as many as the number of pads to be tested at the arranged slits. The contact plate probe holds a needle so that the needle has a certain length.
申请公布号 KR20090111655(A) 申请公布日期 2009.10.27
申请号 KR20080037366 申请日期 2008.04.22
申请人 INNOWORKS 发明人 BAEK, JONG SOO
分类号 G01R1/073 主分类号 G01R1/073
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