发明名称 Method of making a device for measuring deformation
摘要 A method of making a device for measuring deformation includes a step of depositing a silicon adhesion underlayer on a silicon carbide surface by chemical vapor spraying, and a step of depositing a coating on the silicon adhesion underlayer by atmospheric thermal spraying.
申请公布号 US7607213(B2) 申请公布日期 2009.10.27
申请号 US20080109042 申请日期 2008.04.24
申请人 SNECMA 发明人 BERTRAND PIERRE;CODDET CHRISTIAN;COSTIL SOPHIE;LEMAN FREDERIC;LUKAT SEBASTIEN
分类号 H01S4/00;G01R31/00 主分类号 H01S4/00
代理机构 代理人
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