发明名称 Programmable semiconductor memory device
摘要 The present invention provides a technology which can suppress a variation in a value after a write operation to minimum so as to facilitate multi-bit operation in a semiconductor device such as a phase change memory. A semiconductor device includes: a memory cell having a storage element (phase change material) that stores information depending on a state change by temperature; an I/O circuit; and means which, when writing data, performs a set operation and an operation for writing desired data, measures a resistance value of the storage element by means of a verify operation, and when the resistance value is not within a target range, performs the set operation and the write operation again while changing a voltage to be applied to the storage element.
申请公布号 US7609544(B2) 申请公布日期 2009.10.27
申请号 US20050283689 申请日期 2005.11.22
申请人 RENESAS TECHNOLOGY CORP. 发明人 OSADA KENICHI;KAWAHARA TAKAYUKI
分类号 G11C11/00 主分类号 G11C11/00
代理机构 代理人
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