发明名称 Semiconductor memory device having on die thermal sensor
摘要 A semiconductor memory device includes: a temperature information output unit for measuring an internal temperature of the semiconductor memory device, and generating a plurality of flag signals, each voltage level of which varies according to the measured internal temperature; a self-refresh oscillation unit for providing a self-refresh period corresponding to the measured internal temperature in response to the plurality of flag signals; and a temperature information control unit for determining a measuring period of the temperature information output unit in response to a temperature sensing enable signal and the plurality of flag signals.
申请公布号 US7610165(B2) 申请公布日期 2009.10.27
申请号 US20070819790 申请日期 2007.06.29
申请人 HYNIX SEMICONDUCTOR, INC. 发明人 JEONG CHUN-SEOK;PARK KEE-TEOK
分类号 G01K7/00 主分类号 G01K7/00
代理机构 代理人
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