发明名称 |
Semiconductor memory device having on die thermal sensor |
摘要 |
A semiconductor memory device includes: a temperature information output unit for measuring an internal temperature of the semiconductor memory device, and generating a plurality of flag signals, each voltage level of which varies according to the measured internal temperature; a self-refresh oscillation unit for providing a self-refresh period corresponding to the measured internal temperature in response to the plurality of flag signals; and a temperature information control unit for determining a measuring period of the temperature information output unit in response to a temperature sensing enable signal and the plurality of flag signals.
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申请公布号 |
US7610165(B2) |
申请公布日期 |
2009.10.27 |
申请号 |
US20070819790 |
申请日期 |
2007.06.29 |
申请人 |
HYNIX SEMICONDUCTOR, INC. |
发明人 |
JEONG CHUN-SEOK;PARK KEE-TEOK |
分类号 |
G01K7/00 |
主分类号 |
G01K7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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