| 摘要 |
Provided is a testing apparatus for testing a device to be tested. The device is provided with an external interface circuit for receiving/transmitting signals between an internal circuit inside the device and the external of the device. The testing apparatus is provided with a pattern generating section, which inputs a test pattern for testing the external interface circuit to the external interface circuit; an interface control section which makes the external interface circuit output the test pattern by returning the test pattern; and an interface judging section which judges whether the external interface circuit is conforming or not, based on the test pattern outputted from the external interface circuit by returning the test pattern.
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