发明名称 POWER SUPPLY CIRCUIT AND TEST APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To supply large current to the load of an electronic device, or the like, using a power supply section whose current capacity is comparatively small. Ž<P>SOLUTION: A power supply circuit which supplies power to the load, is provided with: the power supply section that outputs a power supply current; a driver section that receives the power supply current from the power supply section and supplies the load with a load current that is consumed by the load; a capacitor section that is charged by the power supply section and that supplies the driver section with an auxiliary current when the load current is greater than the power supply current; and a transmission path that transmits the power supply current output by the power supply section to the driver section, wherein the capacitor section is disposed between the transmission path and a reference potential. Also a test apparatus is provided that includes the power supply circuit. The capacitor section can be provided between the transmission path and the reference potential. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2009245432(A) 申请公布日期 2009.10.22
申请号 JP20090070910 申请日期 2009.03.23
申请人 ADVANTEST CORP 发明人 SAITO HISASHI
分类号 G05F1/56 主分类号 G05F1/56
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