发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To prevent defects from occurring in a semiconductor substrate in a semiconductor device, in a method of manufacturing the same. Ž<P>SOLUTION: A semiconductor device has a silicon substrate 20 in which an active area AR is defined by an element isolating trench 20a and an element isolating insulation film 23 formed in the element isolating trench 20a. The upper face of the element isolating insulation film 23 is lower than that of the silicon substrate 20 in the active area AR. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2009246245(A) 申请公布日期 2009.10.22
申请号 JP20080092963 申请日期 2008.03.31
申请人 FUJITSU MICROELECTRONICS LTD 发明人 SATO KATSUHIRO
分类号 H01L21/76;H01L21/28;H01L27/08;H01L29/78 主分类号 H01L21/76
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