发明名称 |
SEMICONDUCTOR RADIATION DETECTOR |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a semiconductor radiation detector which specifies a material which can replace CdTe and has a small environmental load, and uses it. <P>SOLUTION: There is used the radiation detector comprising a diode configured by utilizing a zinc oxide monocrystal substrate. A Schottky electrode 220 composed of a Pt thin film with a film thickness of 0.1μm is formed on a substrate 210 composed of n-type zinc oxide of a thickness 2 mm. Successively, a Cr thin film 231 with a film thickness of 0.1μm is formed on a lower face of the substrate 210, and further an Au thin film 232 with a film thickness of 0.1μm is formed on a lower face of the Cr thin film 231. The Cr thin film 231 and the Au thin film 232 function as an ohmic electrode 230. Since a current flows in the Schottky diode when a radiation is incident on the substrate 210, it is possible to detect the radiation. <P>COPYRIGHT: (C)2010,JPO&INPIT</p> |
申请公布号 |
JP2009246073(A) |
申请公布日期 |
2009.10.22 |
申请号 |
JP20080089432 |
申请日期 |
2008.03.31 |
申请人 |
IWATE INDUSTRIAL RESEARCH CENTER;IWATE INFORMATION SYSTEM CORP |
发明人 |
ENDO HARUYUKI;MEGURO KAZUYUKI;SUGIBUCHI MASATSUGU |
分类号 |
H01L31/09;G01T1/24;H01L27/14;H01L29/47;H01L29/861;H01L29/872 |
主分类号 |
H01L31/09 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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