发明名称 |
MEASURING APPARATUS HAVING NANOTUBE PROBE |
摘要 |
PROBLEM TO BE SOLVED: To improve the electric conductivity of a nanotube probe by reducing the electric resistance of a carbon nanotube and further the electric resistance between a metal substrate and the carbon nanotube, achieve uniform diameters, and improve the measuring accuracy of a measuring apparatus in measuring apparatuses such as an electric conductivity characteristics evaluation apparatus and a probe microscope using a nanotube as a probe. SOLUTION: The electric conductivity characteristics evaluation apparatus has the nanotube probe using a means such as the application of a metal coating after covering the surface of a nanotube with a graphene sheet small piece to improve the wettability of metal. The electric conductivity characteristics evaluation apparatus alternately has a nanotube probe in which a metal coating is applied to an amorphous nanotube made of a graphene sheet. COPYRIGHT: (C)2010,JPO&INPIT
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申请公布号 |
JP2009243999(A) |
申请公布日期 |
2009.10.22 |
申请号 |
JP20080089169 |
申请日期 |
2008.03.31 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORP |
发明人 |
OKAI MAKOTO;HIROOKA MASAYUKI |
分类号 |
G01N27/04;B82Y15/00;B82Y35/00;G01Q70/12;G01R1/067 |
主分类号 |
G01N27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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