发明名称 MEASURING APPARATUS HAVING NANOTUBE PROBE
摘要 PROBLEM TO BE SOLVED: To improve the electric conductivity of a nanotube probe by reducing the electric resistance of a carbon nanotube and further the electric resistance between a metal substrate and the carbon nanotube, achieve uniform diameters, and improve the measuring accuracy of a measuring apparatus in measuring apparatuses such as an electric conductivity characteristics evaluation apparatus and a probe microscope using a nanotube as a probe. SOLUTION: The electric conductivity characteristics evaluation apparatus has the nanotube probe using a means such as the application of a metal coating after covering the surface of a nanotube with a graphene sheet small piece to improve the wettability of metal. The electric conductivity characteristics evaluation apparatus alternately has a nanotube probe in which a metal coating is applied to an amorphous nanotube made of a graphene sheet. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2009243999(A) 申请公布日期 2009.10.22
申请号 JP20080089169 申请日期 2008.03.31
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 OKAI MAKOTO;HIROOKA MASAYUKI
分类号 G01N27/04;B82Y15/00;B82Y35/00;G01Q70/12;G01R1/067 主分类号 G01N27/04
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