发明名称 |
ANTIFERROELECTRIC GATE TRANSISTOR AND MANUFACTURING METHOD THEREOF, AND NON-VOLATILE MEMORY ELEMENT |
摘要 |
<p>An antiferroelectric gate transistor is used instead of a ferroelectric gate transistor. The antiferroelectric gate transistor comprises a silicon substrate, an antiferroelectric film of a perovskite structure with residual polarization formed over the silicon substrate via a gate insulating film, a gate electrode formed over the antiferroelectric film with the residual polarization and diffusion regions formed within the silicon substrate on a first side of the gate electrode and on a second side opposite to the first side.</p> |
申请公布号 |
WO2009128133(A1) |
申请公布日期 |
2009.10.22 |
申请号 |
WO2008JP57288 |
申请日期 |
2008.04.14 |
申请人 |
FUJITSU LIMITED;SATO, KEISUKE;KURIHARA, KAZUAKI;MARUYAMA, KENJI |
发明人 |
SATO, KEISUKE;KURIHARA, KAZUAKI;MARUYAMA, KENJI |
分类号 |
H01L21/8246;H01L27/105;H01L29/78 |
主分类号 |
H01L21/8246 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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