发明名称 ANTIFERROELECTRIC GATE TRANSISTOR AND MANUFACTURING METHOD THEREOF, AND NON-VOLATILE MEMORY ELEMENT
摘要 <p>An antiferroelectric gate transistor is used instead of a ferroelectric gate transistor. The antiferroelectric gate transistor comprises a silicon substrate, an antiferroelectric film of a perovskite structure with residual polarization formed over the silicon substrate via a gate insulating film, a gate electrode formed over the antiferroelectric film with the residual polarization and diffusion regions formed within the silicon substrate on a first side of the gate electrode and on a second side opposite to the first side.</p>
申请公布号 WO2009128133(A1) 申请公布日期 2009.10.22
申请号 WO2008JP57288 申请日期 2008.04.14
申请人 FUJITSU LIMITED;SATO, KEISUKE;KURIHARA, KAZUAKI;MARUYAMA, KENJI 发明人 SATO, KEISUKE;KURIHARA, KAZUAKI;MARUYAMA, KENJI
分类号 H01L21/8246;H01L27/105;H01L29/78 主分类号 H01L21/8246
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