发明名称 TEMPERATURE CONTROL WITHIN STORAGE DEVICE TESTING SYSTEMS
摘要 <p>A storage device test slot thermal control system includes a test slot (500, 500a, 500b, 540) including a housing (508, 550) having an outer surface (530, 559), an internal cavity (517, 556) defined by the housing and including a test compartment (526, 560) for receiving and supporting a storage device transporter (400) carrying a storage device (600) for testing, and an inlet aperture (528, 551) extending from the outer surface of the housing to the internal cavity. The storage device test slot thermal control system also includes a cooling conduit (710), and a thermoelectric device (742) mounted to the cooling conduit. The thermoelectric device is configured to cool or heat an air flow entering the internal cavity through the inlet aperture.</p>
申请公布号 WO2009129403(A2) 申请公布日期 2009.10.22
申请号 WO2009US40835 申请日期 2009.04.16
申请人 TERADYNE, INC.;MERROW, BRIAN, S. 发明人 MERROW, BRIAN, S.
分类号 G05D23/00;G01R31/02;G11B20/18 主分类号 G05D23/00
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