摘要 |
<P>PROBLEM TO BE SOLVED: To make settings or adjustments associated with a clock more easily than before. <P>SOLUTION: An apparatus includes a VCXO, a memory for storing a reference frequency and a reference level as a voltage level for causing the VCXO to generate a clock having the reference frequency, and a D/A converter control unit and a D/A converter which generate the clock having the required frequency by applying the reference frequency stored in the memory and a voltage determined with reference to the reference level to the VCXO. The apparatus supplies a voltage corresponding to each in-test level to the VCXO while suitably changing the in-test level to generate a clock for test. The clock for test is output to a frequency counter. When it is confirmed with the frequency counter that a difference between the frequency of the clock for test and a target frequency is within a predetermined range, an in-test level when the clock for test is generated by the VCXO is stored as a reference level in the memory, and the frequency of the clock for test is stored as a reference frequency. <P>COPYRIGHT: (C)2010,JPO&INPIT |