SEMICONDUCTOR TESTING APPARATUS AND TESTING METHOD

摘要

A semiconductor testing apparatus (100) for performing a test on a first device (200) as a device under test by connecting the first device (200) which comprises a transmitter transmitting a differential signal and a second device (220) which comprises a receiver receiving the differential signal. The transmitter includes an equalizer circuit (210) which shapes a waveform of the differential signal to be transmitted. The receiver includes a latch circuit (230) which latches data according to the received differential signal using a clock with variable timing. A control section (16) changes parameters of the equalizer circuit (210) and edge timing of a clock (CLK) supplied to the latch circuit (230) in a matrix manner.