发明名称 LOW-FREQUENCY BIAS POWER IN HDP-CVD PROCESSES
摘要 A substrate processing system has a housing that defines a process chamber. A substrate holder disposed within the process chamber supports a substrate during substrate processing. A gas-delivery system introduces a gas into the process chamber. A pressure-control system maintains a selected pressure within the process chamber. A high-density plasma generating system forms a plasma having a density greater than 1011 ions/cm3 within the process chamber. A radio-frequency bias system generates an electrical bias on the substrate at a frequency less than 5 MHz. A controller controls the gas-delivery system, the pressure-control system, the high-density plasma generating system, and the radio-frequency bias system.
申请公布号 US2009263594(A1) 申请公布日期 2009.10.22
申请号 US20090493878 申请日期 2009.06.29
申请人 APPLIED MATERIALS, INC. 发明人 WANG RONGPING;LAI CANFENG;TRACHUK YURI;SALIMIAN SIAMAK
分类号 C23C16/50;C23C16/40 主分类号 C23C16/50
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