发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device capable of preventing the characteristic of a bipolar transistor from degrading. Ž<P>SOLUTION: This manufacturing method of a semiconductor device 100 includes processes of: forming a planar bipolar transistor 1 on a region A of a silicon substrate 11; forming a cover film 32a formed of a silicon nitride film to cover the region on which the planar bipolar transistor 1 is formed; and thereafter implanting ions into the region on which the bipolar transistor 1 is formed in a state where the region A on which the planar bipolar transistor 1 is formed is covered with the cover film 32a. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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申请公布号 |
JP2009246117(A) |
申请公布日期 |
2009.10.22 |
申请号 |
JP20080090478 |
申请日期 |
2008.03.31 |
申请人 |
SANYO ELECTRIC CO LTD |
发明人 |
SUZUKI ATSUYORI;IHARA YOSHIKAZU |
分类号 |
H01L21/331;H01L21/8222;H01L21/8224;H01L21/8228;H01L21/8248;H01L21/8249;H01L27/06;H01L27/082;H01L29/73;H01L29/737 |
主分类号 |
H01L21/331 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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