| 摘要 |
<P>PROBLEM TO BE SOLVED: To input a test signal in small scale without providing a test signal line in addition to a normal operation line. Ž<P>SOLUTION: On each of stages, a digital signal corresponding to partial bits is generated from an input analog signal, an analog reference signal is generated based on the digital signal by a DA conversion section 7, 8 and a remainder operation is performed upon the input analog signal by a remainder operation section 9. In place of the input analog signal, a test signal is inputted to execute a predetermined test. Under a test mode, a control section 14a exerts control to shut off supply of the input analog signal to the remainder operation section, to stop selecting a reference voltage of the DA conversion section based on the digital signal, to select the reference voltage based on a DA conversion control signal for test, and to supply the remainder operation section with a test signal constituted of a predetermined reference voltage in place of the input analog signal and an analog reference signal. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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