发明名称 METHOD OF MANUFACTURING A PHOTO MASK
摘要 PURPOSE: A manufacturing method of a photo mask is provided to form a photo mask having uniform critical dimension distribution by correcting the photo mask according to an evaluation result of the photo mask. CONSTITUTION: A photo mask is provided(S1). The photo mask is evaluated by detecting an aerial image through exposure of the photo mask(S2). An optical parameter of the photo mask related to the aerial image is corrected according to an evaluation result(S3). An exposure of the photo mask for detecting the aerial image uses the same lighting system as exposure for transferring the photo mask on a wafer.
申请公布号 KR20090110615(A) 申请公布日期 2009.10.22
申请号 KR20080036208 申请日期 2008.04.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, MYOUNG SOO;SUNG, YOUNG SU;KIM, HEE BOM;LEE, MIN KYUNG;LEE, DONG GUN
分类号 H01L21/027 主分类号 H01L21/027
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