发明名称 MULTI-COIL PROBE FOR EDDY CURRENT FLAW DETECTION
摘要 <P>PROBLEM TO BE SOLVED: To restrain lift-off noise from being generated even when an unevenness exists on a surface of an inspected object, in non-contact inspection using a multi-coil for eddy current flaw detection. Ž<P>SOLUTION: The multi-coil probe for eddy current flaw detection includes a frame, a plurality of coils for eddy current flaw detection provided on the frame so as to advance and retreat in a direction of the inspected object, and a plurality of protrusions integrated with the coils and arranged on a side of the coils for eddy current flaw direction facing the inspected object. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2009244280(A) 申请公布日期 2009.10.22
申请号 JP20090173835 申请日期 2009.07.27
申请人 HITACHI LTD 发明人 NONAKA YOSHIO;NISHIMIZU AKIRA;KOIKE MASAHIRO
分类号 G01N27/90 主分类号 G01N27/90
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