发明名称 Contactless measurement of beam current in charged partical beam system
摘要 A beam current measurement assembly for measuring a current of a charged particle beam in a charged particle beam device having a charged particle beam source is described. The beam current measurement assembly includes a beam modulation unit for repeatedly changing the current of the charged particle beam for providing a modulated charged particle beam, and a measurement unit adapted for measuring an inductive signal generated by the repeatedly changing charged particle beam current.
申请公布号 EP2110844(A1) 申请公布日期 2009.10.21
申请号 EP20080154575 申请日期 2008.04.15
申请人 ICT, INTEGRATED CIRCUIT TESTING GESELLSCHAFT FUERHALBLEITERPRUEFTECHNIK MBH 发明人 FROSIEN, JUERGEN
分类号 H01J37/244;G01R19/00;H01J37/24 主分类号 H01J37/244
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